JustinReedMD(He/Him)

Family Medicine • Granger, IN

Family Medicine Physician

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Office
52500 N Fir Rd
440
Granger, IN 46530
Phone+1 574-271-0700

Fax+1 574-367-3761

Education & Training

Saint Joseph Health SystemResidency, Family Medicine, 2019 - 2022
University of Washington School of MedicineClass of 2019
Boise State UniversityBS, Electrical & Computer Engineering, 2005 - 2009

Certifications & Licensure

IN State Medical License 2021 - 2025
American Board of Family Medicine Family Medicine

Publications & Presentations

Journal Articles

Defective Angiogenesis and Intraretinal Bleeding in Mouse Models With Disrupted Inner Retinal Lamination
A. Simmons, M. Merrill, J. Reed, M. Deans, M. Edwards, and P. Fuerst, Investigative Ophthalmology & Visual Science. vol. 57, no. 4, pp. 1563-1577. 10.1167/iovs.15-18395, 4/5/2016
Limitations of Frenkel-Poole Conduction in Bilayer HfO2/SiO2 MOS devices
R. G. Southwick III, J. Reed, C. Buu, R. Butler, G. Bersuker, and W.B. Knowlton, IEEE Transactions on Device and Materials Reliability, vol. 10, no. 2, pp. 201-207, 6/2010

Abstracts/Posters

A Real Pain in My Back Side: An Unexpected Cause of Intractable Back Pain
J. Reed, MD, C. Jordan, MD, ATC, 2021 AMSSM 30th Annual Meeting, Virtual, 4/2021
Cirrhosis with Subacute Ascites: A Collection of Unexpected Findings
J. Reed, J. Miller, MD, F. Vega, MD, 2018 ACP Internal Medicine Meeting, Boise, Idaho, 4/2018
Cirrhosis with Subacute Ascites: A Collection of Unexpected Findings
J. Reed, J. Miller, MD, F. Vega, MD, 2018 Idaho ACP/Hindson Conference, 1/2018
Neural Architecture’s Influence on Developing Retinal Vessels
J. Reed, A. Simmons, M. Merrill, P. Fuerst, 2015 INBRE Undergraduate Poster Day, 8/5/2015
Initial Investigations of Sub-RF AC Methods for Metal-Oxide-Semiconductor Devices and Trap-Based Flash Nonvolatile Memory
J. Reed, C. Buu, R.G. Southwick III, B. Yurke, W.B. Knowlton, 2009 Boise State Undergraduate Research Conference, Boise, Idaho, 4/14/2009
Experimental Evidence for Polaron Hopping Conduction in HfO2 - A Cryogenic Study
J. Reed, R. Southwick III and W.B. Knowlton, 2008 IEEE International Integrated Reliability Workshop, 10/12/2008
Preliminary Study of Temperature Dependence of TiN/3nm HfO2/1.1nm SiO2/Si Gated MOSFET
R. G. Southwick III, J. Reed, G. Bersuker, and W. B. Knowlton, 2008 Boise State Undergraduate Research Conference, Boise, Idaho, 4/2008
Chalcogenide-Metal Alloys and Layered Chalcogenide Material Devices for Application in Multi-State Phase-Change Electronic Memory
K. A. Campbell, M. Davis, R. Southwick III, H. Bui, J. Reed, W. B. Knowlton, and J. M. Peloquin, 2008 Spring MRS Meeting, San Francisco, 3/24/2008
Preliminary Study of Temperature Dependence of TiN/3nm HfO2/1.1nm SiO2/Si Gated MOSFET
R. G. Southwick III, J. Reed, G. Bersuker, and W. B. Knowlton, 2007 IEEE International Integrated Reliability Workshop, 10/15/2007
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Other

Temperature (5.6-300K) Dependence Comparison of Carrier Transport Mechanisms in HfO2/SiO2 and SiO2 MOS Gate Stacks
R.G. Southwick III, J. Reed, C. Buu, H. Bui, R. Butler, G. Bersuker, and W.B. Knowlton, paper presentation at the 2008 IEEE International Integrated Reliability Workshop
https://ieeexplore.ieee.org/document/4796084
10/12/2008